Nanostructured Surfaces Investigated by Quantitative Morphological Studies
DIFA Authors: Martina Perani, Daniela Cavalcoli
Codice DOI: DOI: 10.1088/0957-4484/27/18/185703
Altri Link Utili: Nanotechnology, 27(18), 185703, 2016
Two different tools have been combined: the analysis of the height-height correlation function (HHCF) and the determination of the mean grain size; different materials have been analyzed: SiOxNy thin films, InGaN/GaN quantum wells and Si nanowires, grown with different techniques. The results show that this method represents a valuable tool for gaining a deep insight on surface morphology. The approach of combining both HHCF and grain size analysis and cross-correlate the results is completely general and allow extracting a more insightful morphological analysis for nanostructured surfaces.